World e-ID General Assessment Questionnaire - Smart Event 2010 - September 21-24, 2010 - Sophia Antipolis

	For Partners

	For Speakers

	For Press

	Download the Smart Event Program Brochure

Smart Event Home > World e-ID Program > World e-ID General Assessment Questionnaire

Dear World e-ID 2010 attendee,

Thank you very much for attending the foremost tech conference dedicated e-ID Management & e-Government Applications.

Your assessment will help us in preparing and improving next year edition. Thanks for taking 5 minutes of your time to complete the following questionnaire. The details provided in the following form will remain confidential.

	Very good	Good	Fair	Poor
Content of the conference
Quality of speeches and/or speakers
Timing
Networking opportunities and Interactive Exchanges
Organization
Lunches and Breaks
Visual Support
Conference Venue
Proceedings
Pricing policy (level of price, categories…)

Your suggestions:

YOUR OPINION ON OTHER SMART EVENT '10 CONFERENCE STREAMS:

	Positive	Negative	Not attended
e-Smart
Smart Mobility

Comments:

ASSESSMENT OF THE " WORLD E-ID " SESSIONS:

Sessions	Very Good	Good	Fair	Poor	Best Presentation	Poor Presentation
Opening Session: Part 1 - Privacy and Trust in Future Social Networking Part 2 - Panel Discussion: Trusted Mobility: Smart Security Vs. IT Security?
eGov. Services cases in & out Europe (Part 1 & Part 2)
Border Control Systems
Technologies Trends (Part 1 & Part 2)
Roadmap for Future Global e-ID
EU-Funded Projects results
Technologies & Infrastructures
eHealth: from eHealth to mHealth
Biometrics